JPS5859811A - 超音波ボンデイング方法及び装置 - Google Patents
超音波ボンデイング方法及び装置Info
- Publication number
- JPS5859811A JPS5859811A JP57157936A JP15793682A JPS5859811A JP S5859811 A JPS5859811 A JP S5859811A JP 57157936 A JP57157936 A JP 57157936A JP 15793682 A JP15793682 A JP 15793682A JP S5859811 A JPS5859811 A JP S5859811A
- Authority
- JP
- Japan
- Prior art keywords
- bonding
- wire
- force
- bond
- ultrasonic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K20/00—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating
- B23K20/10—Non-electric welding by applying impact or other pressure, with or without the application of heat, e.g. cladding or plating making use of vibrations, e.g. ultrasonic welding
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/78—Apparatus for connecting with wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/4501—Shape
- H01L2224/45012—Cross-sectional shape
- H01L2224/45014—Ribbon connectors, e.g. rectangular cross-section
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/4501—Shape
- H01L2224/45012—Cross-sectional shape
- H01L2224/45015—Cross-sectional shape being circular
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45117—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/45124—Aluminium (Al) as principal constituent
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/78—Apparatus for connecting with wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/852—Applying energy for connecting
- H01L2224/85201—Compression bonding
- H01L2224/85205—Ultrasonic bonding
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01014—Silicon [Si]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01039—Yttrium [Y]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01075—Rhenium [Re]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1203—Rectifying Diode
- H01L2924/12033—Gunn diode
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Wire Bonding (AREA)
- Lining Or Joining Of Plastics Or The Like (AREA)
- Pressure Welding/Diffusion-Bonding (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US300728 | 1981-09-10 | ||
US06/300,728 US4373653A (en) | 1981-09-10 | 1981-09-10 | Method and apparatus for ultrasonic bonding |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5859811A true JPS5859811A (ja) | 1983-04-09 |
JPH0141031B2 JPH0141031B2 (en]) | 1989-09-01 |
Family
ID=23160334
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57157936A Granted JPS5859811A (ja) | 1981-09-10 | 1982-09-10 | 超音波ボンデイング方法及び装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US4373653A (en]) |
JP (1) | JPS5859811A (en]) |
CA (1) | CA1181933A (en]) |
DE (1) | DE3233629A1 (en]) |
GB (1) | GB2107235B (en]) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4606490A (en) * | 1982-08-24 | 1986-08-19 | Asm Assembly Automation Limited | Apparatus and method for automatic evaluation of a bond created by an ultrasonic transducer |
JPS5963737A (ja) * | 1982-10-04 | 1984-04-11 | Hitachi Ltd | 布線の接続方法 |
US4586642A (en) * | 1985-05-13 | 1986-05-06 | Kulicke And Soffa Industries Inc. | Wire bond monitoring system |
US4696708A (en) * | 1985-11-13 | 1987-09-29 | Amp Incorporated | Ultrasonic welding |
DE3701652A1 (de) * | 1987-01-21 | 1988-08-04 | Siemens Ag | Ueberwachung von bondparametern waehrend des bondvorganges |
EP0279216A1 (de) * | 1987-02-09 | 1988-08-24 | Siemens Aktiengesellschaft | Gerät zur Messung von Bondparametern |
US4786860A (en) * | 1987-04-08 | 1988-11-22 | Hughes Aircraft Company | Missing wire detector |
DE4001367A1 (de) * | 1990-01-18 | 1991-09-19 | Branson Ultraschall | Vorrichtung zum einstellen eines maschinenparameters beim reibungsschweissen |
US5186776A (en) * | 1990-05-07 | 1993-02-16 | Foster-Miller, Inc. | Composite laminate translaminar reinforcement apparatus and method |
US5459672A (en) * | 1990-07-30 | 1995-10-17 | Hughes Aircraft Company | Electrical interconnect integrity measuring method |
JPH0547860A (ja) * | 1991-08-08 | 1993-02-26 | Shinkawa Ltd | ワイヤボンデイング方法 |
DE4131565C2 (de) * | 1991-09-18 | 2002-04-25 | Bleich Karl Heinz | Verfahren zur Optimierung des Schweißprozesses bei Bondverfahren |
US5170929A (en) * | 1992-05-29 | 1992-12-15 | International Business Machines Corporation | Ultrasonic adhesion/dehesion monitoring apparatus with acoustic transducer means |
US5466506A (en) * | 1992-10-27 | 1995-11-14 | Foster-Miller, Inc. | Translaminar reinforcement system for Z-direction reinforcement of a fiber matrix structure |
AU7470394A (en) * | 1993-05-04 | 1995-02-20 | Foster-Miller Inc. | Truss reinforced foam core sandwich structure |
US5374808A (en) * | 1993-06-23 | 1994-12-20 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Method and device for determining bond separation strength using induction heating |
US5772814A (en) * | 1996-01-26 | 1998-06-30 | Branson Ultrasonic Corporation | Welding system and method of setting welding machine parameters |
US6291049B1 (en) | 1998-10-20 | 2001-09-18 | Aztex, Inc. | Sandwich structure and method of making same |
KR100896828B1 (ko) * | 2001-10-26 | 2009-05-12 | 외르리콘 어셈블리 이큅먼트 아게, 슈타인하우젠 | 와이어 본더를 보정하는 방법 |
EP1310319B1 (de) * | 2001-11-07 | 2006-09-06 | F & K Delvotec Bondtechnik GmbH | Prüfverfahren für Bondverbindungen und Drahtbonder |
US20050029328A1 (en) * | 2003-06-18 | 2005-02-10 | Esec Trading Sa | Method for checking the quality of a wedge bond |
DE102005059004A1 (de) * | 2005-12-08 | 2007-06-14 | Haver & Boecker Ohg | Verfahren und Vorrichtung zum Füllen von Säcken |
ATE472387T1 (de) | 2006-09-05 | 2010-07-15 | Univ Berlin Tech | Verfahren und vorrichtung zur regelung der herstellung von drahtbondverbindungen |
DE102016102164A1 (de) | 2016-02-08 | 2017-08-10 | Ms Ultraschall Technologie Gmbh | Ultraschall-Bearbeitungsmaschine |
JP6680239B2 (ja) * | 2017-02-20 | 2020-04-15 | 日亜化学工業株式会社 | 発光装置の製造方法 |
WO2022098697A1 (en) * | 2020-11-05 | 2022-05-12 | Kulicke And Soffa Industries, Inc. | Methods of operating a wire bonding machine, including methods of monitoring an accuracy of bonding force on a wire bonding machine, and related methods |
US11798911B1 (en) * | 2022-04-25 | 2023-10-24 | Asmpt Singapore Pte. Ltd. | Force sensor in an ultrasonic wire bonding device |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3302277A (en) * | 1964-03-20 | 1967-02-07 | Western Electric Co | Methods of bonding electrical conductors to electrical components |
US3458921A (en) * | 1965-07-19 | 1969-08-05 | Western Electric Co | Short pulse vibratory bonding |
US3763545A (en) * | 1972-04-03 | 1973-10-09 | Motorola Inc | Method for control of welding apparatus |
US3827619A (en) * | 1973-01-19 | 1974-08-06 | Us Navy | Ultrasonic bond monitor |
US3794236A (en) * | 1973-05-07 | 1974-02-26 | Raytheon Co | Monitoring and control means for evaluating the performance of vibratory-type devices |
GB1506164A (en) * | 1974-07-09 | 1978-04-05 | Mullard Ltd | Ultrasonic bonding apparatus |
-
1981
- 1981-09-10 US US06/300,728 patent/US4373653A/en not_active Expired - Lifetime
-
1982
- 1982-09-02 GB GB08225067A patent/GB2107235B/en not_active Expired
- 1982-09-03 CA CA000410727A patent/CA1181933A/en not_active Expired
- 1982-09-10 DE DE19823233629 patent/DE3233629A1/de active Granted
- 1982-09-10 JP JP57157936A patent/JPS5859811A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
CA1181933A (en) | 1985-02-05 |
DE3233629C2 (en]) | 1993-03-25 |
GB2107235B (en) | 1985-03-20 |
US4373653A (en) | 1983-02-15 |
JPH0141031B2 (en]) | 1989-09-01 |
DE3233629A1 (de) | 1983-03-17 |
GB2107235A (en) | 1983-04-27 |
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